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Deep Learning in Attosecond Metrology (bibtex)
by C. Brunner, A. Duensing, C. Schröder, M. Mittermair, V. Golkov, M. Pollanka, D. Cremers and R. Kienberger
Reference:
Deep Learning in Attosecond Metrology (C. Brunner, A. Duensing, C. Schröder, M. Mittermair, V. Golkov, M. Pollanka, D. Cremers and R. Kienberger), In Optics Express, OSA, volume 30, 2022.
Bibtex Entry:
@article{Brunner2022,
author = {C. Brunner and A. Duensing and C. Schröder and M. Mittermair and V. Golkov and M. Pollanka and D. Cremers and R. Kienberger},
title = {Deep Learning in Attosecond Metrology},
journal = {Optics Express},
year = {2022},
keywords = {attosecond metrology, photoelectron spectroscopy, deep learning, physics, attosecond streak camera, streaking, Neural networks; Phase retrieval; Photoelectron spectra; Power spectra; Streak cameras; Time resolved spectroscopy},
volume = {30},
number = {9},
pages = {15669--15684},
publisher = {OSA},
url = {https://opg.optica.org/OE/abstract.cfm?uri=OE-30-9-15669},
doi = {10.1364/OE.452108},
award = {Editor's Pick},
}
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